Easyscan 2 afm manual

Manuals subdirectory of the directory where the easyScan 2 software is installed. The first part of the manual starts with Chapter 1: The easyScan 2 STM (page 12), which provides an introduction to the easyScan 2 STM system, and with Chapter 2: Installing the easyScan 2 STM (page 19), which should be read when installing your system. This manual is meant as a reference for the easyScan E-Line software. It applies to software version This manual consists of two parts. The first part contains an explanation of the concepts behind the software and the user interface. This part should be read entirely to understand the software well. The second part is a reference of all.  · Th e easyScan 2 AFM system is a modular scanning probe system that can be upgraded to obtain more measurement capabilities. Perform basic system that allow all different, 1. Manual Fix For precise image enhancement control, adjust the brightness, contrast and sharpen sliders.

This manual gives instructions on how to set up and use your easyScan E-AFM system. This introduction chapter gives some general information on the atomic force microscopy technique, and its implementation in the easy-Scan E-AFM. The next chapter, (Un)packing and Installation, should be read when installing your easyScan system. The Nanosurf easyScan 2 AFM is an atomic force microscope system that can make nanometer scale resolution measurements of topography and sev-. About this Manual. This manual is divided into two parts: The first part provides instructions on how to set up and use your Nanosurf easyScan 2 AFM system. The Nanosurf easyScan 2 AFM is an atomic force microscope system that can make nanometer scale resolution measurements of topography and sev- eral other properties of a sample. The easyScan 2 AFM system is a modular scanning probe system that can be upgraded to obtain more measurement capabilities. Page Features.

The Nanosurf easyScan 2 AFM is an atomic force microscope system that can make nanometer scale resolution measurements of topography and sev-. About this Manual. This manual is divided into two parts: The first part provides instructions on how to set up and use your Nanosurf easyScan 2 AFM system. Atomic force Microscope (Nanosurf Easyscan 2 AFM), Reference sample. 3 Theory Introduction Atomic force microscope (AFM) is a an extremely versatile and powerful high resolution (typically in nanometer range) microscope, that can provide detailed scans revealing the nanoscale topographical features of sample. The AFM can. 66 Nanosurf easyScan 2 AFM MEASUREMENT MODES 66 Both the Force Modulation mode and the Spreading Resistance mode are an extension of the Static Force mode. The procedure for a first Static Force mode measurement is basically the procedure described for the Dynamic Force mode in chapter A First Meas- urement (p).